Impedance/Dielectric Spectroscopy of Electroceramics–Part 1: Evaluation of Composite Models for Polycrystalline Ceramics
نویسنده
چکیده
In the microcrystalline regime, the electrical (impedance/dielectric) behavior of grain boundarycontrolled electroceramics is well described by the “brick-layer model” (BLM). In the nanocrystalline regime, however, grain boundary layers can represent a significant volume fraction of the overall microstructure. Simple boundary-layer models no longer adequately describe the electrical properties of nanocrystalline ceramics. The present work describes the development of a pixel-based finite-difference approach to treat a “nested-cube model” (NCM), which is used to investigate the validity of existing models for describing the electrical properties of polycrystalline ceramics over the entire range of grain core vs. grain boundary volume fractions, from the nanocrystalline regime to the microcrystalline regime. The NCM is shown to agree closely with the Maxwell-Wagner effective medium theory.
منابع مشابه
Impedance/Dielectric Spectroscopy of Electroceramics in the Nanograin Regime
In the microcrystalline regime, the behavior of grain boundary-controlled electroceramics is well described by the “brick layer model” (BLM). In the nanocrystalline regime, however, grain boundary layers can represent a significant volume fraction of the overall microstructure and simple layer models are no longer valid. This work describes the development of a pixel-based finite-difference app...
متن کاملX-Ray Analysis and Dielectric Characterization of Bismuth Layered (Bi2O3) (Baxfe1-Xo3) Nanocrystalline Ceramic
Polycrystalline ceramics of bismuth layered structure of (Bi2O3)(BaxFe1-xO3) (0.2x0.8, x is in step of 0.2) have been prepared by conventional solid-state reaction method to study its modified dielectric and electrical properties. X-ray diffraction technique is used on the powdered samples for physical characterization and an average grain size of 16 – 21 nm was obtained. The XRD analysis rev...
متن کاملPotential and Impedance Imaging of Polycrystalline BiFeO3 Ceramics
Electrostatic-force-sensitive scanning probe microscopy (SPM) is used to investigate grain boundary behavior in polycrystalline BiFeO3 ceramics. Scanning surface potential microscopy (SSPM) of a laterally biased sample exhibits potential drops due to resistive barriers at the grain boundaries. In this technique, the tips acts as a moving voltage probe detecting local variations of potential ass...
متن کاملStructural, Electrical, and impedance spectroscopy studies of Barium substituted nano calcium ferrites synthesized by solution combustion method.
Barium substituted nanocrystalline ferrites with chemical composition BaxCa1-xFe2O4 (x =0.0 to 0.25) BCAF were prepared by solution combustion method. The phase formation of mixed spinal structured ferrites was confirmed by PXRD analysis. The average crystallite size was calculated using Debye-Scherrer formula and it was found to be in the range of 27-44 nm. Surface morphology was analyzed by S...
متن کاملStudy the Effect of Silicon Nanowire Length on Characteristics of Silicon Nanowire Based Solar Cells by Using Impedance Spectroscopy
Silicon nanowire (SiNW) arrays were produced by electroless method on polycrystalline Si substrate, in HF/ AgNO3 solution. Although the monocrystalline silicon wafer is commonly utilized as a perfect substrate, polycrystalline silicon as a low cost substrate was used in this work for photovoltaic applications. In order to study the influence of etching time (which affects the SiNWs length) on d...
متن کامل